Unisers secures USD 14 million to develop contamination detection in production of semiconductors

20.02.2023

Unisers develops solutions for the identification of invisible contamination-caused defects in semiconductor materials. The Venture Kick alum has raised a seed round led by Intel Capital that will accelerate its progression.

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Unisers' CEO and co-founder, Ali Altun
Particle contamination during the manufacturing process of semiconductor chips causes billions of dollars in losses, while also having a negative environmental impact. Yet, so far, finding the source of such contaminants has been costly and time-consuming.

Unisers developed a particle monitoring platform that uses surface-enhanced Raman scattering to identify the source of contamination, facilitating stronger product yield and lower carbon footprint at chip manufacturing plants. 

"The demand for the unique capabilities of our technology is rapidly growing and the money will enable us to deliver first alpha systems to selected customers quickly," said the company in a statement on LinkedIn. The ETH spin-off provides a solution for monitoring the defectivity of individual process chemicals by detecting the size, concentration, and composition of particles with cutting-edge sensitivity and molecular specificity.

The proceeds from the seed round will enable Unisers to accelerate the delivery of its commercial products to leading semiconductor partners by 2023. The company will be able to demonstrate the value of the technology in several further critical use cases.  Intel Capital led the round, with participation from M Ventures, RSBG Ventures, and Swisscom Ventures.

"We are very excited to have closed this seed round with several strong investors who share our belief that our unique technology will become a must-have solution for contamination control all along the semiconductor manufacturing value chain," said Ali Altun, CEO and founder of UNISERS.  

The startup was awarded CHF 10,000 by Venture Kick in 2018.

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